Author Archives: LV_TS_Test_Engineer_3000_VI

When you are  Initializing the Equipments and setting values to default it may take sometime. Provide the operator  of your application with a GUI presenting  the success of the initialization process. Provide a Pass/Fail or Green/Red indicator as the initialization process … Continue reading →

Some customers or in-house procedures will required that a barcode be decoded or outputted. Products that need to get tested have a traveler (document which contain the history of the product) and related to the UUT serial number and or part … Continue reading →

Some sites of interest  relating to MathCad, OrCAD, AutoCAD tutorial      MathCAD tutorial      LabVIEW and Thrid Party Math Packages      OrCAD Schematic tutorial      AutoCAD YouTube tutorial OrCAD  — Cadence LabVIEW — National Instruments AutoCAD — Autodesk MathCAD — MathSoft — Parametric Technology … Continue reading →

Agilent has a complete USB module rack (cage) system for a large range of USB module. The USB modules can be used as stand alone or  used as part of a USB module rack solution. This setup can be used … Continue reading →

Selection of top panel mounting configuration can help the test engineers in charge of checkout and integration. Look at the following images  and see how the slide out top panel will make the minimum pain in checkout and reinstalling. Images are not … Continue reading →

To be able to have a certain rise/fall time (10/90) perecent  measurement a minimum bandwidth must be meet. The general rules:   T(second)=0.35/BW(Hz) T=Rise / Fall Time BW=Bandwidth  BW           T        MHz          ns 10             35.000 20             17.500 30             11.667 40             8.750 50             … Continue reading →

Many time when you are assign a task in test equipment as the Test Engineer while the Design Team is working on the product that you will need to automate. This is a great time to find out what instruments they are using and which … Continue reading →

RF Attenuator reduce RF power. One purpose is to protect both the DUT and Measuring Device from exceeding input power max. Exceeding input power can damage expensive DUT and Measuring Device (ex Spectrum Analyzer). RF Attenuator come as Fixed,Manual (steps), … Continue reading →

The effects of changing Resolution Bandwidth (RBW) and Video Bandwidth (VBW) setting on a spectrum analyzer. Small frequencies for RBW setting will lower noise floor. Small frequencies for VBW setting will lower noise amplitude. Small frequencies for RBW and VBW … Continue reading →